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고객의 만족을 위하여 최선을 다하는 기업, 정문사이언스입니다.
고객의 만족을 위하여 최선을 다하는 기업, 정문사이언스입니다.
This equipment can perform measurement of photoelectric current distribution of various solar cells and the photoelectric converting elements such as SiPD, CCD and CMOS. For measurement method, Laser Beam Induced Current has been employed.
As standard, 532nm of the green laser is provided with the system with moving the sample in the X-Y direction ande then short circuit current (Isc) is measured. The system has achieved 10µm spacial resolution and is capable to measure the sample up to 50×50mm.
Especially, for the perovskite solar cells and etc., which are manufactured in spin coating method, there is problem of diffrence of uniformity between the center and the edge on the sample surface.
This system is ideal to evaluate such samples. And this system can be also used to evaluate uniformity of coating materials for SiPD, CCD and CMOS.
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Catalog(PDF) |
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Measurement data of Perovskite proevided by Professor Miyasaka of Toin University of Yokohama in Japan
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Laser wavelength | 520nm (±10nm) |
Output | 1mW |
Irrdiation area | approx. 10µm |
Stability | ±5%/h |
Class | Class 2 in the international standard |
XY stage | ±25mm, 0.01mm minimum step |
Current measurement | 10fA~20mA |
●Laser Light source ( wavelength 520nm )
●XY Stage
●Electrometer
●Sample chamber( with a manual shutter )
●Note PC
●Dedicated software for LBC-2
●Laser(375/406/445/473/488/635/650/670/785/808/830/850/904/980nm)
●Observation camara and monitor
●Automatic shutter mechanism
●Si Photo diode
●Main unit:Approx.W750×D570×H650mm
*excluding the electrometer, stage controller and the PC