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P Type Directional Solidification Mono like Solar Wafer Including 166mm*166mm

모델명 :
  • - Crystallinity : Monocrystalline
  • - Conductivity type : P-type
  • - Dopant : Boron

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P Type Directional Solidification Mono like Solar Wafer Including 166mm*166mm

P Type Directional Solidification Mono like Solar Wafer Including 166mm*166mm

Directional solidification monocrystalline solar wafer is one of the promising alternative wafer materials compared with monocrystalline silicon wafer and multicrystalline silicon wafer due to its relatively higher conversion efficiency and lower production cost. But there is still a large room to improve the crystal quality and to reduce the manufacturing cost, which could push the wafers into photovoltaic industry practically.
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Directional Solidification Monocrystalline wafer 1


Directional Solidification Monocrystalline wafer 3


Directional solidification mono like solar wafer is one of the promising alternative wafer materials compared with monocrystalline silicon wafer and multicrystalline silicon wafer due to its relatively higher conversion efficiency and lower production cost. But there is still a large room to improve the crystal quality and to reduce the manufacturing cost, which could push the wafers into photovoltaic industry practically. 

  

1      Material properties

 

Property

Specification

Inspection   Method

Growth   method

directional   solidification

XRD

Crystallinity

Monocrystalline

Preferential   Etch TechniquesASTM   F47-88

Conductivity   type

P-type

Napson   EC-80TPN

P/N

Dopant

Boron

-

Oxygen concentration[Oi]

1E+17   at/cm3

FTIR (ASTM   F121-83)

Carbon concentration[Cs]

1E+18   at/cm3

FTIR (ASTM   F123-91)

 

2      Electrical properties

 

Property

Specification

Inspection   Method

Resistivity

0.5-2 Ωcm (After anneal)

Wafer inspection system

MCLT (minority carrier lifetime)

10 μs

Sinton QSSPC

 

3      Geometry

 

Property

Specification

Inspection   Method

Geometry

Square or   Rectangle

Wafer inspection system

Bevel edge shape

Line

Wafer inspection system

Wafer size

(Side length*side length)

156mm*156mm

157mm*186mm

166mm*166mm

Wafer inspection system

Angle between adjacent sides

90±3°

Wafer inspection system